Timing performance of nanometer digital circuits under process variations

Bibliographic Details
Main Authors:	Champac, Victor (Author), Garcia Gervacio, Jose (Author)
Corporate Author:	SpringerLink (Online service)
Format:	Electronic Resource
Language:	English
Published:	Cham Springer International Publishing [2018] Washington, DC Island Press [2018]
Series:	Frontiers in Electronic Testing
Subjects:	Systems engineering. Computer science. Electronics. Electronic books.
Online Access:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy