Analysis of die tilt effect on silicon die crack propagation in a small outline transistor using computational fracture mechanics

In today's microelectronic industry, the increasing demand for miniaturization and high functions integration poses a big challenge in maintaining the reliability of the package. Several studies were conducted to address these challenges. It was found out that majority of the reliability proble...

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Bibliographic Details
Main Author: Fabular, Jennifer J. (Author)
Other Authors: Danao, Louis Angelo M. (adviser.), Mena, Manolo G. (adviser.)
Format: Thesis
Language:English
Subjects: