Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Bibliographic Details

Main Author:	Stanisavljevic, Milos
Corporate Author:	SpringerLink (Online service)
Other Authors:	Schmid, Alexandre, Leblebici, Yusuf
Format:	Electronic Resource
Language:	English
Published:	New York Springer New York 2011.
Subjects:	Nanoelectromechanical systems > Reliability. Nanoelectronics. Electronic books.
Online Access:	Available for University of the Philippines Diliman via SpringerLink. Click here to access