Scanning probe microscopy of functional materials nanoscale imaging and spectroscopy

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...

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Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Kalinin, Sergei V.
Format:	Electronic Resource
Language:	English
Published:	New York Springer c2010.
Subjects:	Scanning probe microscopy. Electronic books.
Online Access:	Available for University of the Philippines Diliman via SpringerLink. Click here to access