Museum assessment and FDH technology a global approach

Museum assessment and FDH technology a global approach

Bibliographic Details
Main Author: Mairesse, Francois
Other Authors: Eeckaut, Philippe Vanden
Format: Book
Language:English
Published: Belgium Center for Operations Research & Econometrics Universite Catholique de Louvain, 1999.
Series:CORE discussion paper no.9938
Subjects:
Museums.
Museums > Evaluations > Mathematical models.