Showing 1 - 2 results of 2 for search '"Frontiers in Electronic Testing"', query time: 0.02s Refine Results
  1. 1

    Timing performance of nanometer digital circuits under process variations by Champac, Victor, Garcia Gervacio, Jose

    Published 2018
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Timing performance of nanometer digital circuits under process variations
  2. 2

    Soft errors in modern electronic systems

    Published 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Soft errors in modern electronic systems

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