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  1. 1

    PVT-aware digital techniques for low-power, 0.5V, on-chip processing unit for the SmartWire node in 65nm CMOS process by Sebastian, Sherry Joy Alvionne

    Published 2014
    Thesis

    PVT-aware digital techniques for low-power, 0.5V, on-chip processing unit for the SmartWire node in 65nm CMOS process
  2. 2

    Strain-engineered MOSFETs by Maiti, C. K.

    Published 2013
    Available for University of the Philippines Diliman College of Engineering via CRCnetBASE. Click here to access
    Also available remotely for University of the Philippines Diliman College of Engineering via CRCnetBASE. Click here to access thru EZproxy
    Electronic Resource

    Strain-engineered MOSFETs
  3. 3

    Nanoscale memory repair by Horiguchi, Masashi

    Published 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Nanoscale memory repair
  4. 4

    Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements

    Published 2005
    Book

    Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements
  5. 5

    Manufacturing yield evaluation of VLSI/WSI systems

    Published 1995
    Book

    Manufacturing yield evaluation of VLSI/WSI systems

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