Electrical overstress (EOS) devices, circuits, and systems

Electrical overstress (EOS) devices, circuits, and systems

Bibliographic Details
Main Author: Voldman, Steven H. (Author)
Format: Book
Language:English
Published: Chichester, West Sussex, United Kingdom John Wiley & Sons Inc. 2014.
Subjects:
Semiconductors > Failures.
Semiconductors > Protection.
Transients (Electricity)
Overvoltage.