X-ray diffractometry and raman spectroscopy investigation of silicon nanowires fabricated via electroless etching

X-ray diffractometry and raman spectroscopy investigation of silicon nanowires fabricated via electroless etching

Bibliographic Details
Main Author: Cabello, Neil Irvin F.
Format: Thesis
Language:English
Published: 2012.
Subjects:
Raman spectroscopy.
X-ray diffractometer.
Silicon > Electric properties.