Built-in self-test implementation on ARM7TDM-S microprocessor

The total cost of integrated chips is composed of the design cost, production cost, and testing cost. As integrated chips increase in complexity, testing through automatic test equipment (ATE) becomes very expensive and time-consuming. Built-in self-test (BIST) primarily addresses these problems. Th...

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Bibliographic Details

Main Author:	Esguerra, Ralph Joseph A.
Other Authors:	Marimla, Josef Ronald A., Retirado, Aga Nasser E.
Format:	Thesis
Language:	English
Published:	2010
Subjects:	Integrated circuits > Testing. Microprocessors > Testing. ARM7TDM-S microprocessor.