Statistical approach to VLSI

Bibliographic Details
Other Authors:	Director, Stephen W., Maly, W.
Format:	Book
Language:	English
Published:	Amsterdam North-Holland 1994.
Series:	Advances in CAD for VLSI v. 8
Subjects:	Integrated circuits > Very large scale integration > Defects. Integrated circuits > Very large scale integration > Design and construction > Statistical methods. Mathematical optimization.