Optical imaging and metrology advanced technologies

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics -- Source other than Library of Con...

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Bibliographic Details
Other Authors: Osten, Wolfgang (Editor), Reingand, Nadya (Editor)
Format: Electronic Resource
Language:English
Published: Weinheim Wiley-VCH [2012]
Subjects:
Online Access:Available for University of the Philippines Baguio via Wiley Online Library. Click here to access