Analysis of crack propagation under different die tilt configuration on a small outline transistor

Bibliographic Details
Published in:Philippine Engineering Journal Vol. 41, no. 1 (2020), 19-32
Main Author: Callanga, Jennifer F.
Other Authors: Macaspac, Hannah Erika, Danao, Louis Angelo M., Mena, Manolo
Format: Article
Language:English
Published: 2020
Subjects: